SEMATECH Patents

SEMATECH research performed by SEMATECH direct hire employees and member company assignees, and by universities and national labs has resulted in the following patents. These patents may be owned by the various entities doing the research, but are owned by or licensed to SEMATECH and all of its member companies.

Patents owned by SEMATECH are available for license to third parties. For more information, contact the SEMATECH Law Department at (512)356-3412 or send an e-mail message to law.department@sematech.org.

Patent Number Title Date Issued
6100184 Method of making a Dual Damascene Interconnect Structure Using Low Dielectric Constant Material for an Inter-level Dielectric Layer   08-Aug-00
6037664 Dual Damascene Interconnect Structure Using Low Dielectric Constant Materials for an Inter-level dielectric layer 14-Mar-00
5959348 Construction of PBGA Substrate for Flip Chip Packing 28-Sep-99
5891513 Electroless Cu Deposition on a Barrier Layer by Cu Contact Displacement for ULSI Applications 6-Apr-99
5881208 Heater and Temperature Sensor Array For Rapid Thermal Processing Thermal Core 9-Mar-99
5866031 Slurry Formulation for Chemical Mechanical Polishing of Metals 2-Feb-99
5867020 Capacitively Coupled RF Voltage Probe Having Optimized Flux Linkage 2-Feb-99
5846398 CMP Slurry Measurement and Control Technique 8-Dec-98
5840629 Copper Chemical Mechanical Polishing Slurry Utilizing a Chromate Oxidant 24-Nov-98
5834931 RF Current Sensor 10-Nov-98
5830805 Electroless Deposition Equipment or Apparatus and Method of Performing Electroless Deposition 3-Nov-98
5824599 Protected Encapsulation of Catalytic Layer for Electroless Copper Interconnect 20-Oct-98
5770982 Self Isolating High Frequency Saturable Reactor 23-Jul-98
5783497 Forced-Flow Wafer Polisher 21-Jul-98
5736457 Method of Making a Damascene Metallization 7-Apr-98
5695810 Use of Cobalt Tungsten Phosphide as a Barrier Material for Copper Metallization 9-Dec-97
5675403 Stress-free Mount for Imaging Mask 7-Oct-97
5674652 Diffracted Light from Latent Images in Photoresist for Exposure Control 7-Oct-97
5674787 Selective Electroless Copper Deposited Interconnect Plugs for ULSI Applications 7-Oct-97
5665656 Method and Apparatus for Polishing a Semiconductor Substrate Wafer 9-Sep-97
5622608 Process of Making Oxidation Resistant High Conductivity Copper Layers 22-Apr-97
5660706 Electric Field Initiated Electroless Metal Deposition 26-Aug-97
5635333 Antireflective Coating Process 3-Jun-97
5614444 Method of Using Additives with Silica-Based Slurries to Enhance Selectivity in Metal CMP 25-Mar-97
5589422 Controlled, Gas Phase Process for Removal of Trace Metal Contamination and for Removal of a Semiconductor Layer 31-Dec-96
5587038 Apparatus and Process for Producing High Density Axially Extended Plasmas 24-Dec-96
5572398 Tri-Polar Electrostatic Chuck 5-Nov-96
5562530 Pulsed-Force Chemical Mechanical Polishing 8-Oct-96
5555902 Submicron Particle Removal Using Liquid Nitrogen 17-Sep-96
5541436 MOS Transistor Having Improved Oxynitride Dielectric 30-Jul-96
5536559 Stress-Free Mount for Imaging Lithography Masks 16-Jul-96
5531900 Modification of Polyvinylidene Fluoride Membrane and Method of Filtering 2-Jul-96
5508556 Leaded Semiconductor Device Having Accessible Power Supply Pad Terminals 16-Apr-96
5504328 Endpoint Detection Utilizing Ultraviolet Mass Spectrometry 2-Apr-96
5480747 Attenuated Phase Shifting Mask with Buried Absorbers 2-Jan-96
5479340 Real Time Control of Plasma Etch Utilizing Multivariate Statistical Analysis 26-Dec-95
5478435 Point of Use Slurry Dispensing System 26-Dec-95
5474865 Globally Planarized Binary Optical Mask Using Buried Absorbers 12-Dec-95
5472811 Phase Shifting Mask Structure with Multilayer Optical Coating for Improved Transmission 5-Dec-95
5467013 Radio Frequency Monitor for Semiconductor Process Control 14-Nov-95
5472561 Radio Frequency Monitor for Semiconductor Process Control 5-Dec-95
5466991 Optimized ECR Plasma Apparatus with Varied Microwave Window Thickness 14-Nov-95
5456758 Submicron Particle Removal Using Liquid Nitrogen 10-Oct-95
5450205 Apparatus and Method for Real-Time Measurement of Thin Film Layer Thickness and Changes Thereof 12-Sep-95
5439569 Concentration Measurement and Control of Hydrogen Peroxide and Acid/Base Component in a Semiconductor Bath 8-Aug-95
5438204 Twin-Mask, and Method and System for Using Same to Pattern Microelectronic Substrates 1-Aug-95
5432366 P-I-N MOSFET for ULSI Applications 11-Jul-95
5426498 Method and Apparatus for Real-Time Speckle Interferometry for Strain or Displacement of an Object Surface 20-Jun-95
5418885 Three-Zone Rapid Thermal Processing System Utilizing Wafer Edge Heating Means 23-May-95
5418095 Method of Fabricating Phase Shifters with Absorbing/Attenuating Sidewalls Using an Additive Process 23-May-95
5415835 Method for Fine-Line Interferometric Lithography 16-May-95
5411824 Phase Shifting Mask Structure with Absorbing/Attenuating Sidewalls for Improved Imaging 2-May-95
5410256 Dissipation Factor as a Predictor of Anodic Coating Performance 25-Apr-95
5397720 Method of Making MOS Transistor Having Improved Oxynitride Dielectric 14-Mar-95
5436474 Modulation Doped Field Effect Transistor Having Built-In Drift Field 7-Dec-94
5364510 Scheme for Bath Chemistry Measurement and Control for Improved Semiconductor Wet Processing 15-Nov-94
5362606 Positive Resist Pattern Formation Through Focused Ion Beam Exposure and Surface Barrier Silylation 8-Nov-94
5358740 Method for Low Pressure Spin Coating and Low Pressure Spin Coating Apparatus 25-Oct-94
5352327 Reduced Temperature Suppression of Volatilization of Photoexcited Halogen Reaction Products from Surface of Silicon Wafer 4-Oct-94
5344365 Integrated Building and Conveying Structure for Manufacturing Under Ultraclean Conditions 6-Sep-94
5339039 Langmuir Probe System for Radio Frequence Excited Plasma Processing System 16-Aug-94
5279865 High Throughput Interlevel Dielectric Gap Filling Process 18-Jul-94
5326659 Method for Making Masks 5-Jul-94
5324992 Self Timing Integrated Circuits Having Low Clock Signal During Inactive Periods 28-Jun-94
5325019 Control of Plasma Process by Use of Harmonic Frequency Components of Voltage and Current 28-Jun-94
5308742 Method of Anti-Reflection Coating 3-May-94
5306985 ECR Apparatus with Magnetic Coil for Plasma Refractive Index Control 26-Apr-94
5302356 Ultrapure Water Treatment System 12-Apr-94
5302803 Apparatus and Method for Uniform Microwave Plasma Processing Using TE11 and TM01 Modes 12-Apr-94
5302882 Low Pass Filter for Plasma Discharge 12-Apr-94
5286678 Single Step Salicidation Process 15-Feb-94
5284805 Rapid-Switching Rotating Disk Reactor 8-Feb-94
5273610 Apparatus and Method for Determining Power in Plasma Processing 28-Dec-93
5267019 Method and Apparatus for Reducing Fringe Interference in Laser Spectroscopy 30-Nov-93
5264040 Rapid-Switching Rotating Disk Reactor 23-Nov-93
5253324 Conical Rapid Thermal Processing Apparatus 12-Oct-93
5233460 Method and Means for Reducing Speckle in Coherent Laser Pulses 3-Aug-93
5216257 Method and Apparatus for Alignment and Overlay of Submicron Lithographic Features 1-Jun-93
5237878 Apparatus and Method for Sampling Ultra-Pure Chemical 24-Aug-93
5211729 Baffle/Settling Chamber for Chemical Vapor Deposition Equipment 18-May-93
5196380 Reactive Membrane for Filtration and Purification of Gases of Impurities 23-Mar-93
5186597 Apparatus for Servicing of Semiconductor Equipment 16-Feb-93
5164790 Simple CD Measurement of Periodic Structures on Photomasks 17-Nov-92
5159267 Pneumatic Energy Fluxmeter 27-Oct-92
5159264 Pneumatic Energy Fluxmeter 27-Oct-92
5155337 Method and Apparatus for Controlling Rapid Thermal Processing Systems 13-Oct-92
5145493 Molecular Restricter 8-Sep-92
5139925 Surface Barrier Silylation of Novolak Film Without Photoactive Additive Patterned with 193 nm Excimer Laser 18-Aug-92
5126289 Semiconductor Lithography Methods Using an ARC of Organic Material 30-Jun-92
5111111 Method and Apparatus for Coupling a Microwave Source in an Electron Cyclotron Resonance System 5-May-92
5102816 Staircase Sidewall Spacer for Improved Source/Drain Architecture 7-Apr-92
5089442 Silicon Dioxide Deposition Method Using a Magnetic Field and Both Sputter Deposition and Plasma Enhanced CVD 18-Feb-92
5057185 Triode Plasma Reactor with Phase Modulated Plasma Control 15-Oct-91
5056875 Container for Use Within a Clean Environment 15-Oct-91
5013691 Anisotropic Deposition of Silicon Dioxide 7-May-91
5062446 Intelligent Mass Flow Controller 5-Nov-91
5178840 Single Wafer Regrowth of Silicon 12-Jan-93
5133829 Single Wafer Regrowth of Silicon 28-Jul-92
5161717 Spin Casting of Silicon Wafers 10-Nov-92
5074421 Quartz Tube Storage Device 24-Dec-91
4483737 Method and Apparatus for Plasma Etching a Substrate 20-Nov-84