98013448A-TR Abstract: Overview of Quality and Reliability Issues in the National Technology Roadmap for Semiconductors

SEMATECH DOC ID #: 98013448A-TR

Title: Overview of Quality and Reliability Issues in the National Technology Roadmap for Semiconductors

Author(s): Dino Barpoulis;

Document date: 01/20/1998

Descriptor(s): design;failure analysis;packaging;quality management;reliability;reliability modeling;silicon;

Abstract: This document is an update to the 1994 Quality and Reliability Roadmap issued
in support of the 1994 National Technology Roadmap for Semiconductors. This
report revisits the challenges, constraints, priorities, and research needs
pertaining to quality and reliability issues. It also provides key project
proposals that must be implemented to address concerns about reliability
attainment and defect learning. An expanded section on test-to-test,
diagnostics, and failure analysis; an edited version of the Product Analysis
Forum Roadmap; and an appendix containing a draft report highlighting
reliability issues is included.

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