SEMATECH DOC ID #: 03124475A-ENG
Title: Immersion Lithography Modeling 2003 Year-End Report
Author(s): Alexander Wei;Amr Abdo;Andrew Grenville;Edward Lovell;Gerald Dicks;Gregory Nellis;Jaehyuk Chang;Roxann Engelstad;Walter Trybula;
Document date: 12/12/2003
Descriptor(s): 193 nm lithography;process modeling;simulation;lenses;birefringence;immersion lithography;fluid flow;computational fluid dynamics;
Abstract:
This report from the LITH130 project summarizes the modeling and
experimental results of using immersion lithography for fluid
dispensing, fluid heating, fluid/structure interactions, wafer
topology, and shock loading effects at 193 nm.
© Copyright 2008 SEMATECH, Inc.
Please read these important Trademark and legal notices