SEMATECH DOC ID #: 04024492A-TR

Title: Understanding and Developing Knowledge-based Qualifications of Silicon Devices

Author(s): C. A. Preussger;N. Lycoudes;R. Blish;S. Huber;T. Dellin;

Document date: 03/30/2004

Descriptor(s): reliability testing;test methods;qualification plan;risk management;

Abstract:  Knowledge-based reliability qualification differs from standards-
based methods in that it comprehends the end-user environment and
failure mechanism based-methods. With this approach, the
challenges and tradeoffs of qualification can be more flexibly
addressed than with a standards-based approach. Understanding
interrelationships of design, technology, manufacturing, and
product attributes is essential. Risk management should be viewed
as an integral element. Critical considerations for developing a
knowledge-based qualification (KBQ) plan include selecting
technology- and product-relevant structures for reliability
evaluation and establishing assessment models and criteria for
them. Further discussion and observations about using the KBQ
approach include the extrapolation of results from test
structures to products and the problem that accepted failure
models may not be available. Some brief examples of KBQ are
given.

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