Standards |
| Document # | Document Name | Publication Date |
| 39933 |
Wait Time Waste (WTW) Metrics and Methods Guidance v1.0 |
05/21/2013 |
| 38927 |
Wait Time Waste STEP July 2012 |
07/19/2012 |
| 11065150A-ENG |
ISMI Equipment Data Acquisition (EDA) Evaluation Method for the July 2010 Standards Freeze level: Version 1.0 |
07/18/2011 |
| 10115124A-ENG |
Equipment Data Acquisition (EDA) Version 0710 Guidance |
11/29/2010 |
| 35938 |
Semiconductor Industry SPC Practices |
11/19/2010 |
| 35939 |
Semiconductor Industry MSA Practices |
11/19/2010 |
| 06094783D-ENG |
SEMI S23 Application Guide and Total Equivalent Energy (TEE) CalcII User's Guide |
11/08/2010 |
| 06034748D-ENG |
Equipment Data Acquisition (EDA) Version 1105 Guidance |
08/30/2010 |
| 09055011B-ENG |
Equipment Data Acquisition (EDA) Change Summary: November 2005 to July 2010 |
06/17/2010 |
| 05074664C-ENG |
International SEMATECH Manufacturing Initiative (ISMI) Equipment Data Acquisition (EDA) Evaluation Method: Version 4.0 |
11/20/2009 |
| 06034748C-ENG |
Equipment Data Acquisition (EDA) Guidance |
05/07/2009 |
| 08064933A-ENG |
ISMI Manual Material Handling Risk Characterization Guideline |
06/09/2008 |
| 03044393H-ENG |
Semiconductor Equipment and Manufacturing Standards Activities Timeline and Roadmap, Rev. 09, December 2005 |
12/14/2005 |
| 03084426C-ENG |
Manufacturing Operation and Exception Scenarios for Reliable High Volume Manufacturing: Version 3.0 |
07/26/2004 |
| 04014488A-TR |
300 mm Operational Flowcharts and Scenarios, V. 10 |
05/03/2004 |
| 02114345B-ENG |
International SEMATECH Semiconductor Industry Standards Conformance Guidelines: Assessment Criteria and Processes, Rev. 2 |
07/29/2003 |
| 03034388A-ENG |
Automatic Data Collection (ADC) Requirements for Tracking Tool Performance |
04/16/2003 |
| 02064276A-ENG |
Guidelines for the Installation and Alignment of 300 mm Overhead Transport Systems (OTS) and Load Port Interfaces |
06/19/2002 |
| 00124063B-ENG |
300 mm Best-Known Practices (300 BKP) for 300 mm Factory Integration |
11/29/2001 |
| 01044112A-ENG |
Prober Interface Communications Guideline |
04/26/2001 |
| 00094004A-ENG |
Automatic Data Collection Baseline Requirements: Levels1 and 2 Events and Variables |
10/25/2000 |
| 99063760B-TR |
Guide for the Design of Semiconductor Equipment to Meet Voltage Sag Immunity Standards |
12/13/1999 |
| 99033693A-ENG |
Integrated Minienvironment Design Best Practices |
03/29/1999 |
| 97033270B-ENG |
Equipment Class Application Guideline |
12/02/1998 |
| 98013447A-STD |
SEMATECH Guide for Documenting Tool Installation Time and Cost |
01/28/1998 |
| 97063297B-XFR |
Demonstration Test Method - Revision 1 |
09/30/1997 |
| 96063137A-ENG |
SEMATECH Design Guidelines for Gas Box Components |
07/11/1996 |
| 90120403B-STD |
SEMASPEC Test Method for XPS Analysis of Surface Composition and Chemistry of Electropolished Stainless Steel Tubing for Gas Distribution System Compo |
04/01/1993 |
