e-Diagnostics and EEC Workshop
18 July 2003

(All Presentations are in .PDF format)

• Usage of Interface A - T. Gow
• e-Diagnostics and EEC Guidance - H. Wohlwend
• Interface A Standards (EDA, CEM) - J. Martin
• XML Messaging - B. Hodges
• EDA Network Bandwidth - A. Shah
• Selete EEC/EES Prototypes - S. Kobayashi
• EES Prototype Demonstration on CMP System - I. Nambu
• Supplier Perspective on Interface A - M. Sakamoto
• Supplier Perspective on Interface A - M. Locy
• 300mm Software Testing Experiences - S. Fulton
• Mfg Operation & Exception Scenarios for Reliable High Volume Manufacturing - B. Crandell / G. Stefanski
• Data Quality - B. Van Eck / J. Moyne
• SEMI Standards Improvement - K. Peden
• Closing Comments / Next Steps