Electrostatic Discharge Impact and Control Workshop

14 October 2002

Welcome - Opening Remarks - Agenda
Andrew Rudack/ISMT

Keynote
David Swenson/National ESD Association Board of Directors

S20.20 Program and Certification
David Swenson/3M

SEMI E78, ITRS and future issues in Electrostatics Control
Arnie Steinman/Ion Systems

Overview of EMI-related Standards and Their Applicability to Cleanrooms
Vladimir Kraz/Credence Technologies

Tool Design for Electrostatic Compatibility
Jeff Bruner/KLA-Tencor

Effect of Dew Point and Relative Humidity on Charge Generation
Julian Montoya/Intel

Integrating ESD Induced EMI and Voltage Monitoring into DUV Lithography Tools
Andrew Rudack/ISMT

Wafer Charge Exit Specification using LSF
Larry Levit/Ion Systems

ISMT Calibration Lab ESD Monitoring Progress Review
Jason Moore, ISMT