EUV Source Workshop

06 May 2007
Baltimore, MD

Introduction Vivek Bakshi, SEMATECH

Technology Update

 
Cymer David Brandt, Cymer
Gigaphoton Hakaru Mizoguchi, Gigaphoton
Philips Extreme UV Marc Corthout, Philips Extreme UV
Xtreme technologies Uwe Stamm, Xtreme technologies

Panel Discussion

view video   Introductions Vivek Bakshi, SEMATECH (moderator)
view video   Canon Akira Miyake, Canon
view video   Nikon Katshuhiko Murakami, Nikon
view video   AMD Obert Wood, AMD
view video   IBM Kurt Kimmel, IBM
view video   Intel Yashesh Shroff, Intel
view video   Cymer Igor Fomenkov, Cymer
view video   Gigaphoton Hakaru Mizoguchi, Gigaphoton
view video   Philips Extreme UV Marc Corthout, Philips Extreme UV
view video   Xtreme technologies Uwe Stamm, Xtreme technologies
view video   Media Lario Konrad Knapp, Media Lario

High Power CO2 Lasers

 
Coherent Eric Mueller, Coherent
Cymer Igor Fomenkov, Cymer
EUVA Akira Endo, EUVA
Report Out: High Power CO2 Lasers Eric Mueller, Coherent / Kurt Weingarten, Time-Bandwidth Products, Inc.

High Power Nd: YAG Lasers

 
Powerlase Samir Ellwi, Powerlase
Fraunhofer - Aachen / Edgewave Dieter Hoffman, Fraunhofer - Aachen / Edgewave
Osaka University Hisanori Fujita, Osaka University
Japan Atomic Energy / Agency Hiromitsu Kiriyama, Japan Atomic Energy Agency
Report Out: High Power Nd: YAG lasers Samir Ellwi, Powerlase / Hiromitsu Kiriyama, Japan Atomic Energy Agency

High Power Fiber Based Lasers

 
Aculight Seattle Fabio Di Teodoro, Aculight Seattle
Fraunhofer Institute Jena Jens Limpert, Fraunhofer Institute Jena
University of Central Florida Martin Richardson, University of Central Florida
University of Michigan Almantas Galvanauskas, University of Michigan
Report Out: High Power fiber based lasers Fabio Di Teodoro, Aculight Corporation / Almantas Galvanauskas, University Michigan

Technical Presentations

 
Temporal and Spatial Multiplexing Approaching for LLP Martin Richardson , University of Central Florida
Modeling with the Code Z* of EUV Emmision and Fast Particles Generation in DPP and LPP Sources Sergey Zakarov, EPPRA
Review of Tin Debris Mitigation Technology Status and Future Challenges (LPP/DPP) David Ruziz, University of Illinious Urbana Champaign
Update of EUV Source Requirements and EUV Source Workshop Summary Vivek Bakshi, SEMATECH

Posters

 
Development of High Power and High Repetition Solid State Lasers for EUV Lithography Hisanori Fujita, Masahiro Nakatsuka, Ravi Bhushan, Koji Tsubakimoto, Yasushi Fujimoto, Hidetsugu Yoshida, Noriaki Miyanage, and Yasukazu Izawa, Institute of Laser Engineering, Osaka University
Frequency converted short pulse fiber lasers as potential seed source for CO2 regenerative for amplifiers J. Limpert, A. Tunnermann, A. Endo, Friedrich Schiller University, Institute of Applied Science, GigaPhoton
Amplification of 10-nsec laser pulses in CO2 slab amplifiers N. A. Romanov, T. Ariga, A. I. Dutov, A. Endo, D.A. Goryachkin, V. M. Irtuganov, V.P. Kalinin, A. A. Kulshov, N. A. Orlov, A. Yu Rodionov, V.V. Sergeev, V. E. Sherstobitoy, A. A. Smirnov, A. A. Sokolov, E. A. Zoboy, Institute of Laser Physics, St. Petersburg, Russia, EUVA, Hiratsuka R&D Center
Scaling of short pulse CO2 laser in multi 10 kW output power Akira Endo, Hideo Hoshino, Takeshi Asayama, Takashi Suganuma, Tatsuya Ariga, Masato Moriya, Tamotsu Abe, Hiroshi Komori, Akira Sumitani, Hakaru Mizoguchi, EUVA
Evaluation of Xe and Sn droplets as LPP targets Takashi Suganuma, Takayuki Yabu, Masaki Nakano, Hiroshi Someya, Yoshifumi Ueno, Georg Soumagne, Tamotsu Abe, Hiroshi Komori, Akira Sumitani, Akira Endo, EUVA
Combined YAG-CO2 Laser Produced Plasma EUV Source Examination with the Code Z* Georg Soumagne, Sergey V, Zakharov, Peter Choi, Vladimir G. Novikov, Vasily S. Zakharov, Akira Sumitani, EUVA, EPPRA, RRC Kurchatov Institute, Keldysh Institute of Applied Mathematics
Further Improvement of Conversion Efficiency and Mitigation of Fast Ions by Magnetic Field K. Nishihara, M. Murakami, M. Numata, A. Sunahara, A. Takata, H. Ueda, Osaka University, Advance Photon Research Center
Fast Particles in Transient Plasmas and Debris of DPP EUV Sources Modeling with the code Z* Sergey Zakarov, Andrey Berezin, Vladimir Novikov, EPPRA, RRC Kurchatov Institute, Keldysh Institute of Applied Mathematics
Tin removal from EUV collector optics by reactive ion etching S. N. Srivastava, Hyungjoo Shin, D. N. Ruzic, Center for Plasma Material Interactions, University of Illinois at Urbana-Champaign
ACR-based EUV radiometry at NIST S. Grantham, R.E. Vest & C. Tarrio, NIST
Roadmap for facility systems to support EUVL Phil Naughton, ISMI